0 |
ZR802 |
1 |
Device Status |
2 |
PV Out of Limit |
3 |
Non-PV Out of Limit |
4 |
Loop Current Saturated |
5 |
Loop Current Fixed |
6 |
More Status Available |
7 |
Cold Start |
8 |
Configuration Changed |
9 |
Device Malfunction |
10 |
Extended Device Status |
11 |
Failure |
12 |
Out of Specification |
13 |
Function Check |
14 |
Standardized Status 0 |
15 |
Device Configuration Locked |
16 |
Device is in write-protect or is locked. |
17 |
Standardized Status 1 |
18 |
Status Simulation Active |
19 |
The device status reported to the host may not represent the current state of the device. |
20 |
Discrete Variable Simulation Active |
21 |
The device is in simulation mode and one or more of its discrete variables are not representative of the process. |
22 |
Log |
23 |
Device Specific Status 0 |
24 |
Converter user param. failure |
25 |
MAC address read failure |
26 |
Internal com. failure |
27 |
Hardware failure |
28 |
Device Specific Status 1 |
29 |
Sensor user param. failure |
30 |
Sensor EEPROM failure |
31 |
A/D converter failure |
32 |
Heater temperature failure |
33 |
Cell voltage failure |
34 |
Device Specific Status 2 |
35 |
Humidity low low alarm |
36 |
Humidity low alarm |
37 |
Humidity high alarm |
38 |
Humidity high high alarm |
39 |
Oxygen low low alarm |
40 |
Oxygen low alarm |
41 |
Oxygen high alarm |
42 |
Oxygen high high alarm |
43 |
Device Specific Status 3 |
44 |
R.H. low low alarm |
45 |
R.H. low alarm |
46 |
R.H. high alarm |
47 |
R.H. high high alarm |
48 |
Mixing low low alarm |
49 |
Mixing low alarm |
50 |
Mixing high alarm |
51 |
Mixing high high alarm |
52 |
Device Specific Status 4 |
53 |
Cal. stability alarm |
54 |
AO2 saturation |
55 |
Simple cell resist. alarm |
56 |
Device Specific Status 5 |
57 |
TC voltage low alarm |
58 |
TC voltage high alarm |
59 |
CJ temp. low alarm |
60 |
CJ temp. high alarm |
61 |
Span correction low alarm |
62 |
Span correction high alarm |
63 |
Zero correction low alarm |
64 |
Zero correction high alarm |
65 |
Device Specific Status 6 |
66 |
Input pressure low alarm |
67 |
Input pressure high alarm |
68 |
Input temp. low alarm |
69 |
Input temp. high alarm |
70 |
AI current low alarm |
71 |
AI current high alarm |
72 |
Device Specific Status 7 |
73 |
Battery low alarm |
74 |
Device Specific Status 8 |
75 |
Calibration mode |
76 |
Blowback mode |
77 |
Maintenance mode |
78 |
Simple cell resist. mode |
79 |
AO2 fixed |
80 |
Device Specific Status 9 |
81 |
Fast warmup alarm |
82 |
Warmup mode |
83 |
Purging |
84 |
Configuration Change Counter |
85 |
06x |
86 |
Oxygen |
87 |
Humidity |
88 |
Mixing ratio |
89 |
Relative humidity |
90 |
QV |
91 |
.1f |
92 |
.3f |
93 |
.0f |
94 |
Status Bit Not Supported |
95 |
No Effect |
96 |
Maintenance Required |
97 |
Disabled |
98 |
Enabled |
99 |
Reset |
100 |
Set |
101 |
Primary Variable Out of Limits |
102 |
Non-Primary Variable Out of Limits |
103 |
Reserved |
104 |
Critical Power Failure |
105 |
Simulation active |
106 |
Non-Volatile memory failure |
107 |
Volatile memory error |
108 |
Watchdog reset executed |
109 |
Power supply conditions out of range |
110 |
Environmental conditions out of range |
111 |
Electronic failure |
112 |
Device configuration locked |
113 |
Event Notification Overflow |
114 |
Secondary Analog Channel Saturated |
115 |
Tertiary Analog Channel Saturated |
116 |
Quaternary Analog Channel Saturated |
117 |
Quinary Analog Channel Saturated |
118 |
Subdevice list changed |
119 |
Duplicate master detected |
120 |
Sub-device mismatch |
121 |
Sub-devices with duplicate IDs found |
122 |
Stale data notice |
123 |
Capacity Denied |
124 |
Bandwidth allocation pending |
125 |
Block transfer pending |
126 |
Radio failure |
127 |
Secondary Analog Channel Fixed |
128 |
Tertiary Analog Channel Fixed |
129 |
Quaternary Analog Channel Fixed |
130 |
Quinary Analog Channel Fixed |
131 |
Condensed status simulation |
132 |
Allows simulation of different status conditions. |
133 |
Condensed status value |
134 |
Starting Status Map Index must be even value. |
135 |
Bit Index |
136 |
|
137 |
Device status Simulate |
138 |
Extended Device Status Simulate |
139 |
Standardized Status 0 Simulate |
140 |
Standardized Status 1 Simulate |
141 |
AO saturated Simulate |
142 |
AO fixed Simulate |
143 |
Latched Device Diagnostic Status 2 Simulate |
144 |
Latched Device Diagnostic Status 3 Simulate |
145 |
Device Specific Status 0 Simulate |
146 |
Device Specific Status 1 Simulate |
147 |
Device Specific Status 2 Simulate |
148 |
Device Specific Status 3 Simulate |
149 |
Device Specific Status 4 Simulate |
150 |
Device Specific Status 5 Simulate |
151 |
Device Specific Status 6 Simulate |
152 |
Device Specific Status 7 Simulate |
153 |
Device Specific Status 8 Simulate |
154 |
Device Specific Status 9 Simulate |
155 |
Current date |
156 |
Current time |
157 |
Write date |
158 |
2000/01/01 |
159 |
Write time |
160 |
00:00 |
161 |
kg/kg |
162 |
None |
163 |
Not supported |
164 |
.2f |
165 |
Dew point |
166 |
Air ratio |
167 |
Moisture |
168 |
Cell temp |
169 |
CJ temp |
170 |
Cell mV |
171 |
TC mV |
172 |
AI mA |
173 |
Gas temperature |
174 |
Gas gage pressure |
175 |
CJ resistance |
176 |
CJ mV |
177 |
Simple cell resistance |
178 |
AO1 |
179 |
mA |
180 |
AO2 |
181 |
Contact in/out status |
182 |
DO1 closed |
183 |
DO2 closed |
184 |
DO3 closed |
185 |
DO4 closed |
186 |
DI1 closed |
187 |
DI2 closed |
188 |
Zero DO closed |
189 |
Span DO closed |
190 |
Heater duty |
191 |
% |
192 |
Max oxygen |
193 |
Min oxygen |
194 |
Ave oxygen |
195 |
Max oxygen date |
196 |
Max oxygen time |
197 |
Min oxygen date |
198 |
Min oxygen time |
199 |
Max humidity |
200 |
Min humidity |
201 |
Ave humidity |
202 |
Max humidity date |
203 |
Max humidity time |
204 |
Min humidity date |
205 |
Min humidity time |
206 |
Max mixing ratio |
207 |
Min mixing ratio |
208 |
Ave mixing ratio |
209 |
Max mixing ratio date |
210 |
Max mixing ratio time |
211 |
Min mixing ratio date |
212 |
Min mixing ratio time |
213 |
Max R.H. |
214 |
Min R.H. |
215 |
Ave R.H. |
216 |
Max R.H. date |
217 |
Max R.H. time |
218 |
Min R.H. date |
219 |
Min R.H. time |
220 |
1st zero corr. ratio |
221 |
1st span corr. ratio |
222 |
1st cell resistance |
223 |
ohm |
224 |
1st calib. date |
225 |
1st calib. time |
226 |
2nd zero corr. ratio |
227 |
2nd span corr. ratio |
228 |
2nd cell resistance |
229 |
2nd calib. date |
230 |
2nd calib. time |
231 |
3rd zero corr. ratio |
232 |
3rd span corr. ratio |
233 |
3rd cell resistance |
234 |
3rd calib. date |
235 |
3rd calib. time |
236 |
Cell response time |
237 |
s |
238 |
Cell resistance |
239 |
Cell robustness |
240 |
< 1 month |
241 |
3-6 month |
242 |
6-12 month |
243 |
over 1 year |
244 |
Span correction ratio |
245 |
Zero correction ratio |
246 |
Cell mV at latest fault |
247 |
TC mV at latest fault |
248 |
Test auto release time |
249 |
10 min |
250 |
30 min |
251 |
60 min |
252 |
3 hour |
253 |
6 hour |
254 |
12 hour |
255 |
AO test validity |
256 |
Enable AO1 test |
257 |
Enable AO2 test |
258 |
AO1 test output |
259 |
AO2 test output |
260 |
DO test validity |
261 |
Enable DO1 test |
262 |
Enable DO2 test |
263 |
Enable DO3 test |
264 |
Enable DO4 test |
265 |
DO test output |
266 |
Close DO1 |
267 |
Close DO2 |
268 |
Close DO3 |
269 |
Close DO4 |
270 |
Cal. DO test validity |
271 |
Enable Zero DO test |
272 |
Enable Span DO test |
273 |
Cal. DO test output |
274 |
Close Zero DO |
275 |
Close Span DO |
276 |
AO1 time constant |
277 |
AO1 output mode |
278 |
log |
279 |
AO2 is |
280 |
AO2 LRV |
281 |
AO2 URV |
282 |
AO2 time constant |
283 |
AO2 output mode |
284 |
Warmup out. state |
285 |
4mA |
286 |
20mA |
287 |
Preset value |
288 |
Warmup preset val. |
289 |
Maint out. state |
290 |
No hold |
291 |
Last value hold |
292 |
Maint preset val. |
293 |
Cal/BB/S-cell out. state |
294 |
Cal/BB/S-cell preset val. |
295 |
Fault out. state |
296 |
Fault preset val. |
297 |
AO lower limit |
298 |
AO upper limit |
299 |
Range change O2 URV |
300 |
25 % |
301 |
100 % |
302 |
Off |
303 |
On |
304 |
DO1 selection |
305 |
Fault |
306 |
HiHi alarm |
307 |
Hi alarm |
308 |
Lo alarm |
309 |
LoLo alarm |
310 |
Maintenance |
311 |
Calibration |
312 |
Output range switch |
313 |
Warmup |
314 |
Cal gas press drop |
315 |
Temp out of range |
316 |
Pres out of range |
317 |
Blowback |
318 |
Process upset |
319 |
Cal correction alarm |
320 |
Cal stability alarm |
321 |
Simple cell measure |
322 |
Simple cell alarm |
323 |
DO1 state in operation |
324 |
Close |
325 |
Open |
326 |
DO2 selection |
327 |
DO2 state in operation |
328 |
DO3 selection |
329 |
DO3 state in operation |
330 |
DI1 selection |
331 |
Meas. range change |
332 |
Calibration start |
333 |
Blowback start |
334 |
Reboot |
335 |
DI1 state in operation |
336 |
DI2 selection |
337 |
DI2 state in operation |
338 |
Zero gas conc. |
339 |
Span gas conc. |
340 |
Calib. mode |
341 |
Manual |
342 |
Semi-auto |
343 |
Auto, semi-auto |
344 |
Auto calib. procedure |
345 |
Span and Zero |
346 |
Span only |
347 |
Zero only |
348 |
Calib. hold time [min] |
349 |
min |
350 |
Calib. hold time [s] |
351 |
Calib. time [min] |
352 |
Calib. time [s] |
353 |
Calib. interval [d] |
354 |
d |
355 |
Calib. interval [h] |
356 |
h |
357 |
Calib. first start date |
358 |
Calib. first start time |
359 |
Calib. next date |
360 |
Calib. next time |
361 |
Blow hold time [min] |
362 |
Blow hold time [s] |
363 |
Blowback time [min] |
364 |
Blowback time [s] |
365 |
0 s |
366 |
10 s |
367 |
20 s |
368 |
30 s |
369 |
40 s |
370 |
50 s |
371 |
Blow interval [d] |
372 |
Blow interval [h] |
373 |
Blow first start date |
374 |
Blow first start time |
375 |
Blow next date |
376 |
Blow next time |
377 |
S-cell resistance mode |
378 |
S-cell hold time [min] |
379 |
S-cell hold time [s] |
380 |
S-cell interval [d] |
381 |
S-cell interval [h] |
382 |
S-cell first start date |
383 |
S-cell first start time |
384 |
S-cell next date |
385 |
S-cell next time |
386 |
Oxygen LoLo alm conf. |
387 |
Oxygen Lo alm conf. |
388 |
Oxygen Hi alm conf. |
389 |
Oxygen HiHi alm conf. |
390 |
Oxygen LoLo alm SP |
391 |
Oxygen Lo alm SP |
392 |
Oxygen Hi alm SP |
393 |
Oxygen HiHi alm SP |
394 |
Oxygen Hysteresis |
395 |
Humidity LoLo alm conf. |
396 |
Humidity Lo alm conf. |
397 |
Humidity Hi alm conf. |
398 |
Humidity HiHi alm conf. |
399 |
Humidity LoLo alm SP |
400 |
Humidity Lo alm SP |
401 |
Humidity Hi alm SP |
402 |
Humidity HiHi alm SP |
403 |
Humidity Hysteresis |
404 |
Mixing LoLo alm conf. |
405 |
Mixing Lo alm conf. |
406 |
Mixing Hi alm conf. |
407 |
Mixing HiHi alm conf. |
408 |
Mixing LoLo alm SP |
409 |
Mixing Lo alm SP |
410 |
Mixing Hi alm SP |
411 |
Mixing HiHi alm SP |
412 |
Mixing Hysteresis |
413 |
R.H. LoLo alm conf. |
414 |
R.H. Lo alm conf. |
415 |
R.H. Hi alm conf. |
416 |
R.H. HiHi alm conf. |
417 |
R.H. LoLo alm SP |
418 |
R.H. Lo alm SP |
419 |
R.H. Hi alm SP |
420 |
R.H. HiHi alm SP |
421 |
R.H. Hysteresis |
422 |
S-cell resist alm conf. |
423 |
Cal. stability alm conf. |
424 |
Alarm delay time |
425 |
S-cell resist alm SP |
426 |
Zero corr. Hi alm conf. |
427 |
Zero corr. Lo alm conf. |
428 |
Span corr. Hi alm conf. |
429 |
Span corr. Lo alm conf. |
430 |
Battery low alm conf. |
431 |
Fast warmup alm conf. |
432 |
Temp. Hi alm conf. |
433 |
Temp. Lo alm conf. |
434 |
Gage pres. Hi alm conf. |
435 |
Gage pres. Lo alm conf. |
436 |
Model setting |
437 |
Oxygen base |
438 |
Wet |
439 |
Dry |
440 |
Detector |
441 |
ZR22 |
442 |
ZS8D/ZO21DW |
443 |
Temp. type |
444 |
AI |
445 |
Temp. set val |
446 |
Temp. AI 4mA |
447 |
Temp. AI 20mA |
448 |
Temp. Hi alm SP |
449 |
Temp. Lo alm SP |
450 |
Exhaust gas abs. pres. |
451 |
Gage pres. type |
452 |
Gage pres. set val |
453 |
Gage pres. AI 4mA |
454 |
Gage pres. AI 20mA |
455 |
Gage pres. Lo alm SP |
456 |
Gage pres. Hi alm SP |
457 |
Water vapor content |
458 |
m3/kg |
459 |
Theoretical air volume |
460 |
X value |
461 |
Abs. humidity out. air |
462 |
.4f |
463 |
Average time |
464 |
MaxMin time |
465 |
Purging time |
466 |
Meas. log storage cycle |
467 |
1 s |
468 |
2 s |
469 |
5 s |
470 |
Power voltage mode |
471 |
Auto |
472 |
100 V |
473 |
200 V |
474 |
Power frequency mode |
475 |
50 Hz |
476 |
60 Hz |
477 |
Auto return time select |
478 |
Luminance select |
479 |
10 % |
480 |
20 % |
481 |
30 % |
482 |
40 % |
483 |
50 % |
484 |
60 % |
485 |
70 % |
486 |
80 % |
487 |
90 % |
488 |
Backlight auto off time select |
489 |
Temperature unit |
490 |
degC |
491 |
degF |
492 |
Pressure unit |
493 |
kPa |
494 |
psi |
495 |
Adjust touch screen flag |
496 |
Power voltage |
497 |
Power frequency |
498 |
Main software rev |
499 |
IF software rev |
500 |
Asset ID |
501 |
MS code |
502 |
Serial No. |
503 |
SPAN_CAL |
504 |
SPAN_CAL_FIX |
505 |
ZERO_CAL |
506 |
ZERO_CAL_FIX |
507 |
HOLD_TIME |
508 |
IMP_HOLD |
509 |
BLOW_HOLD |
510 |
FINAL_CAL_FIX |
511 |
IO_1 |
512 |
IO_2 |
513 |
MANUAL_HOLD |
514 |
SEMI_HOLD |
515 |
CELL_HOLD_OVER |
516 |
HOLD_CANCEL |
517 |
CAL_CANCEL |
518 |
S_Z_CAL_AUTO_SEMI |
519 |
SUCCEED |
520 |
EXEC_ERR |
521 |
SETTING_ERR |
522 |
INVALID_REQ_ERR |
523 |
WRITE_FLAG_ERR |
524 |
Simple cell robustness |
525 |
AO1 % range |
526 |
AO2 % range |
527 |
quality |
528 |
limit |
529 |
update period |
530 |
Update time period help |
531 |
Oxygen quality |
532 |
Oxygen limit |
533 |
Humidity quality |
534 |
Humidity limit |
535 |
Mixing ratio quality |
536 |
Mixing ratio limit |
537 |
Relative humidity quality |
538 |
Relative humidity limit |
539 |
Dew point quality |
540 |
Dew point limit |
541 |
Air ratio quality |
542 |
Air ratio limit |
543 |
Moisture quality |
544 |
Moisture limit |
545 |
Cell temp quality |
546 |
Cell temp limit |
547 |
CJ temp quality |
548 |
CJ temp limit |
549 |
Gas temperature quality |
550 |
Gas temperature limit |
551 |
Gas gage pressure quality |
552 |
Gas gage pressure limit |
553 |
Cell mV quality |
554 |
Cell mV limit |
555 |
TC mV quality |
556 |
TC mV limit |
557 |
CJ resistance quality |
558 |
CJ resistance limit |
559 |
CJ mV quality |
560 |
CJ mV limit |
561 |
AI mA quality |
562 |
AI mA limit |
563 |
Simple cell resistance quality |
564 |
Simple cell resistance limit |
565 |
Clear config changed flag |
566 |
Clear Configuration Changed Flag |
567 |
Status simulation |
568 |
Test/simulation all clear |
569 |
Adjust touch panel |
570 |
Reset condensed status map |
571 |
AO1 trim |
572 |
AO2 trim |
573 |
Clear AO1 trim |
574 |
Clear AO2 trim |
575 |
Set date & time |
576 |
Change model setting |
577 |
Semi-auto calib. |
578 |
Abort calib. |
579 |
Update calib. results |
580 |
Start blowback |
581 |
Abort blowback |
582 |
Start s-cell resist measure |
583 |
Abort s-cell resist hold |
584 |
Change PV(AO1) selection |
585 |
Change AO2 selection |
586 |
Online |
587 |
Process variables root menu |
588 |
View process variables |
589 |
Dynamic variables |
590 |
Dynamic variables status |
591 |
Device variables |
592 |
IO&physical variables |
593 |
Max&Min&Average |
594 |
Set process variables |
595 |
AO1(PV) range |
596 |
AO2 range |
597 |
View calib. results |
598 |
Calib. constants |
599 |
1st calib. log |
600 |
2nd calib. log |
601 |
3rd calib. log |
602 |
Diagnostics root menu |
603 |
Condensed status map |
604 |
Loop&status test |
605 |
Device root menu |
606 |
Basic setup |
607 |
I/O condition |
608 |
AO hold |
609 |
AO limit/range change |
610 |
AO trim |
611 |
HART output |
612 |
Contact output |
613 |
Contact input |
614 |
Calib. condition |
615 |
Auto calibration timing |
616 |
Blowback condition |
617 |
Auto blowback timing |
618 |
Simple cell resist condition |
619 |
Auto s-cell resist timing |
620 |
Alarm condition |
621 |
Oxygen alarm |
622 |
Humidity alarm |
623 |
Mixing ratio alarm |
624 |
Relative humidity alarm |
625 |
Simple cell resist alarm |
626 |
Other alarms |
627 |
Fuel setting |
628 |
Input temp./pres. setting |
629 |
Oxygen model setting |
630 |
Humidity model setting |
631 |
Other condition |
632 |
Date & Time |
633 |
Max & Min & Average |
634 |
Display |
635 |
Misc |
636 |
Power supply |
637 |
Device information |
638 |
HART identification |
639 |
HART revisions |
640 |
Maintenance root menu |
641 |
Upload variables |
642 |
Offline root menu |
643 |
PV Analog Channel Saturated |
644 |
PV Analog Channel Fixed |
645 |
Wireless |
646 |
WirelessHART Device |
647 |
IEEE 802.15.4 2.4GHz DSSS with O-QPSK Modulation |
648 |
Primary |
649 |
Primary Analog Channel |
650 |
Secondary |
651 |
Secondary Analog Channel |
652 |
Tertiary |
653 |
Tertiary Analog Channel |
654 |
Quaternary |
655 |
Quaternary Analog Channel |
656 |
Quinary |
657 |
Quinary Analog Channel |
658 |
Lock all |
659 |
Trim not supported |
660 |
Configuration cannot be changed |
661 |
Locked by gateway |
662 |
Analog Input Channel |
663 |
Analog Output Channel |
664 |
The device is in simulation mode and the level output is not representative of the process. |
665 |
The Non-Volatile memory check is invalid or maybe corrupt, or the battery of a battery-backed memory has failed. |
666 |
The RAM memory check is invalid or maybe corrupt |
667 |
A watchdog reset has been performed |
668 |
Voltage conditions out of range |
669 |
A voltage condition is outside its allowable range |
670 |
An internal or environmental condition is beyond acceptable limits. |
671 |
A hardware problem not related to the sensor has been detected. |
672 |
The device was unable to acquire the communication bandwidth required to support the Burst Messaging specified |
673 |
Battery life |
674 |
Percent range |
675 |
Loop current |
676 |
Primary variable |
677 |
Secondary variable |
678 |
Tertiary variable |
679 |
Quaternary variable |
680 |
Read receive time |
681 |
Write date and time |
682 |
Non-Volatile Clock |
683 |
When set the device contains a battery-backed clock. In this case, the clock does not need to be reset if there is a power failure. |
684 |
Clock Uninitialized |
685 |
The real-time clock has never been set with the date and time. For example, the clock is volatile and power was removed from and restored to the device. |
686 |
No restrictions |
687 |
SI Only |
688 |
Restricted to SI Unit codes only |
689 |
Process automation device |
690 |
Discrete device |
691 |
Hybrid:Process automation+discrete |
692 |
I/O System |
693 |
WirelessHART Process automation device |
694 |
WirelessHART Discrete device |
695 |
WirelessHART Process automation+discrete |
696 |
WirelessHART Gateway |
697 |
WirelessHART Access point |
698 |
WirelessHART Process adapter |
699 |
WirelessHART Discrete adapter |
700 |
WirelessHART enabled handheld/portable maintenance tool |
701 |
Device Profile |
702 |
US |
703 |
United States of America |
704 |
JP |
705 |
Japan |
706 |
DE |
707 |
Germany |
708 |
FR |
709 |
France |
710 |
ES |
711 |
Spain |
712 |
RU |
713 |
Russian Federation |
714 |
CN |
715 |
People's Republic of China |
716 |
Secondary Master |
717 |
Primary Master |
718 |
Device Diagnostic Status 0 |
719 |
Device Diagnostic Status 1 |
720 |
I/O and Subdevice Status |
721 |
WirelessHART Status |
722 |
Time Set Option |
723 |
Real Time Clock Flags |
724 |
Country |
725 |
Country of intended device installation |
726 |
SI Unit Control |
727 |
Indicates if device should only display SI unit codes |
728 |
Time Stamp |
729 |
Relative time value on network |
730 |
8u |
731 |
Dynamic Variables Returned for Device Variables |
732 |
Command Response Truncated |
733 |
Configuration Change Counter Mismatch |
734 |
Status bytes mismatch |
735 |
Device Variable |
736 |
STX Count |
737 |
Count of STX messages received by this device |
738 |
ACK Count |
739 |
Count of ACK messages received by this device |
740 |
BACK Count |
741 |
Count of BACK messages received by this device |
742 |
8.3f |
743 |
Device returned a response of warning.
Please refer to the following. |
744 |
Device returned a response of error.
Please refer to the following.
After that this operation will be aborted. |
745 |
Are you sure to clear "Configuration Changed Flag"? |
746 |
Exit;Clear |
747 |
Configuration Changed Flag is already off. |
748 |
Configuration Changed Flag was cleared. |
749 |
Failed to clear Configuration Changed Flag. |
750 |
Are you sure to perform device reset ? |
751 |
Exit;Execute |
752 |
Select the status simulation mode: |
753 |
Are you sure to change the status simulation mode ? |
754 |
Status bit simulation was disabled. |
755 |
Target bit to simulate: |
756 |
Exit simulation;Exit (as maintaining simulation);Device Status;Extended Device Status;Standardized Status 0;Standardized Status 1;Device Specific Status 0;Device Specific Status 1;Device Specific Status 2;Device Specific Status 3;Device Specific Status 4;Device Specific Status 5;Device Specific Status 6;Device Specific Status 7;Device Specific Status 8;Device Specific Status 9 |
757 |
Set bit to simulate: |
758 |
There is active status. Please refer to the followings. |
759 |
All status are cleared. |
760 |
Are you sure to clear all simulation? |
761 |
Returning field device to original output |
762 |
Returning field device to original status |
763 |
Are you sure to execute the Touch Panel Adjustment ?
If you select YES, the setting screen will appear on the LCD of the device. |
764 |
The Setting screen is displayed. Please operate the LCD of the device. |
765 |
WARN-Condensed status map will be reset to the default mapping values. |
766 |
Are you sure to reset to the default mapping values? |
767 |
Condensed status values were reset |
768 |
Are you sure to disable status simulation ? |
769 |
Field device output 4mA equal to reference meter ? |
770 |
Field device output 20mA equal to reference meter ? |
771 |
Are you sure to clear AO1 trim ? |
772 |
No;Yes |
773 |
AO1 trim was cleared successfully. |
774 |
Are you sure to clear AO2 trim ? |
775 |
AO2 trim was cleared successfully. |
776 |
Present date & time:
%{v_write_date} %{v_write_time} |
777 |
Set date [YYYY/MM/DD]: |
778 |
Set time [hh:mm]: |
779 |
New date & time:
%{v_write_date} %{v_write_time} |
780 |
Do you want to re-send ? |
781 |
Yes;No |
782 |
Date & time was changed. |
783 |
WARN-When this setting is changed, items for AO output, home screen display and trend display change back to default values. |
784 |
Select new model: |
785 |
Model was changed. |
786 |
Are you sure to start semi-auto calibration? |
787 |
Please wait.. |
788 |
WARN-Configuration error |
789 |
Calibration is started. |
790 |
WARN-Execution failure |
791 |
WARN-HMI is doing maintenance. |
792 |
WARN-Calibration is not running. |
793 |
Are you sure to abort hold time? |
794 |
Are you sure to abort calibration? |
795 |
Please wait until reading is done.. |
796 |
Calibration results are updated. |
797 |
Are you sure to start blowback? |
798 |
Blowback is started. |
799 |
WARN-Blowback is not running. |
800 |
Are you sure to abort blowback? |
801 |
Are you sure to measure simple cell resistance? |
802 |
Measurement is started. |
803 |
WARN-Simple cell resist measurement is not running. |
804 |
WARN-Wait until measuring is completed. |
805 |
WARN-AO range setting will be initialized after this change. |
806 |
AO1 is |
807 |
The settings are changed. |