| 0 |
Illegal Program Type code |
| 1 |
Laser Pump Bias too high |
| 2 |
Receive Bias too high |
| 3 |
Probe Length Too Small |
| 4 |
Probe Length Too High |
| 5 |
Nozzle Length Too Small |
| 6 |
Illegal length units |
| 7 |
Offset Too Small |
| 8 |
Offset Too High |
| 9 |
Point index too large |
| 10 |
Applied Process Too High |
| 11 |
Applied Process Too Low |
| 12 |
Input Point Too High |
| 13 |
Input Point Too Small |
| 14 |
Output Point Too High |
| 15 |
Output Point Too Small |
| 16 |
Illegal Input units |
| 17 |
Illegal Output units |
| 18 |
Invalid Mode requested |
| 19 |
Invalid Selection. The requested action was not valid. |
| 20 |
Invalid Input Mode Selection |
| 21 |
Output Minimum Too High |
| 22 |
Output Minimum Too Small |
| 23 |
Output Maximum Too High |
| 24 |
Output Maximum Too Small |
| 25 |
Linearization Units |
| 26 |
|
| 27 |
Linearization Mode |
| 28 |
Automatic |
| 29 |
Manual |
| 30 |
Linearization Minimum |
| 31 |
.5f |
| 32 |
Linearization Maximum |
| 33 |
.3f |
| 34 |
8.3f |
| 35 |
Input Point 1 |
| 36 |
Input Point 2 |
| 37 |
Input Point 3 |
| 38 |
Input Point 4 |
| 39 |
Input Point 5 |
| 40 |
Input Point 6 |
| 41 |
Input Point 7 |
| 42 |
Input Point 8 |
| 43 |
Input Point 9 |
| 44 |
Input Point 10 |
| 45 |
Input Point 11 |
| 46 |
Input Point 12 |
| 47 |
Input Point 13 |
| 48 |
Input Point 14 |
| 49 |
Input Point 15 |
| 50 |
Input Point 16 |
| 51 |
Input Point 17 |
| 52 |
Input Point 18 |
| 53 |
Input Point 19 |
| 54 |
Input Point 20 |
| 55 |
Output Point 1 |
| 56 |
Output Point 2 |
| 57 |
Output Point 3 |
| 58 |
Output Point 4 |
| 59 |
Output Point 5 |
| 60 |
Output Point 6 |
| 61 |
Output Point 7 |
| 62 |
Output Point 8 |
| 63 |
Output Point 9 |
| 64 |
Output Point 10 |
| 65 |
Output Point 11 |
| 66 |
Output Point 12 |
| 67 |
Output Point 13 |
| 68 |
Output Point 14 |
| 69 |
Output Point 15 |
| 70 |
Output Point 16 |
| 71 |
Output Point 17 |
| 72 |
Output Point 18 |
| 73 |
Output Point 19 |
| 74 |
Output Point 20 |
| 75 |
Clear Table |
| 76 |
Reload Table |
| 77 |
Backup Table |
| 78 |
Input Table |
| 79 |
Outut Table |
| 80 |
SS140 |
| 81 |
Device Parameters |
| 82 |
Process Variables |
| 83 |
Diags / Service |
| 84 |
Device Status |
| 85 |
Analog Output |
| 86 |
Basic Setup |
| 87 |
Device Information |
| 88 |
Revision Info |
| 89 |
Output Conditioning |
| 90 |
Hart Output |
| 91 |
Detailed Setup |
| 92 |
Sensors |
| 93 |
Sensor Info |
| 94 |
Signal Conditioning |
| 95 |
SS140XP Specific |
| 96 |
Linearization |
| 97 |
Review |
| 98 |
Standard Program |
| 99 |
Light Dust Program |
| 100 |
Heavy Dust Program |
| 101 |
Position Program |
| 102 |
Custom Program |
| 103 |
Extended Setup |
| 104 |
Agent Setup |
| 105 |
FPGA Setup |
| 106 |
Factory Menu |
| 107 |
Laser Diagnostics |
| 108 |
|
| 109 |
Voltage |
| 110 |
Noise |
| 111 |
Width |
| 112 |
Measurement |
| 113 |
1) |
| 114 |
2) |
| 115 |
3) |
| 116 |
4) |
| 117 |
K-Tek Assistance |
| 118 |
For assistance in Setup, Commissioning, |
| 119 |
or Troubleshooting or to schedule |
| 120 |
a service technician onsite visit, |
| 121 |
please contact us at: |
| 122 |
Email: service@ktekcorp.com |
| 123 |
Phone: + 1 (225) 673.6100 |
| 124 |
Fax: + 1 (225) 673.2525 |
| 125 |
For manuals and other info: |
| 126 |
Website: ktekcorp.com |
| 127 |
write_variables |
| 128 |
Diagnostics |
| 129 |
Device Tests |
| 130 |
[detailed_setup] |
| 131 |
Linearization Values |
| 132 |
Height |
| 133 |
Percent |
| 134 |
5) |
| 135 |
6) |
| 136 |
7) |
| 137 |
8) |
| 138 |
9) |
| 139 |
10) |
| 140 |
11) |
| 141 |
12) |
| 142 |
13) |
| 143 |
14) |
| 144 |
15) |
| 145 |
16) |
| 146 |
17) |
| 147 |
18) |
| 148 |
19) |
| 149 |
20) |
| 150 |
Crystal Test |
| 151 |
Adjust Bias Values |
| 152 |
Test Crystals |
| 153 |
Save Factory Configuration |
| 154 |
Reload Factory Configuration |
| 155 |
Reset Laser Programs to Factory Defaults |
| 156 |
Level |
| 157 |
Linearized Output |
| 158 |
Level - The total product measurement of the device |
| 159 |
Linearized Output - The output of the linearization table based on Level |
| 160 |
RX Bias |
| 161 |
Laser Pump Bias |
| 162 |
Signal Strength |
| 163 |
7d |
| 164 |
Level Units |
| 165 |
Access Type |
| 166 |
The type of access granted by the password provided |
| 167 |
User |
| 168 |
Agent |
| 169 |
FPGA |
| 170 |
Factory |
| 171 |
Technician |
| 172 |
Laser Range |
| 173 |
23.41 |
| 174 |
46.82 |
| 175 |
93.65 |
| 176 |
187.31 |
| 177 |
374.62 |
| 178 |
749.25 |
| 179 |
1498.5 |
| 180 |
2997.0 |
| 181 |
STD-Fill Rate |
| 182 |
Default: 0.00 ft./min. Material level increase in silo under fill conditions. Default is 0.00 ft./min. When set to 0.00 ft./min, fill rate is not active. |
| 183 |
7.2f |
| 184 |
6.2f |
| 185 |
8.1f |
| 186 |
8.0f |
| 187 |
STD-Empty Rate |
| 188 |
Default: 0.00 ft./min. Material level decrease in silo under discharge conditions. Default is 0.00 ft./min. When set to 0.00 ft./min, empty rate is not active. |
| 189 |
STD-Range Blank |
| 190 |
Default: 0.00 ft. Distance at which is possible for laser to lose signal due to reflecting from polished surface. Example: Stainless Steel vessels in food processing industry. |
| 191 |
STD-Buffer |
| 192 |
Default: 25. Filtering system of the instrument. Change only according to applications specifi cs. |
| 193 |
STD-Keep |
| 194 |
Default: 2: Filtering system of the instrument. Change only according to application specifics. |
| 195 |
STD-Environment |
| 196 |
Default: Dust. Normal - for dust free or minimum dust environment, Dust - for dusty environment. |
| 197 |
Normal |
| 198 |
Dust |
| 199 |
STD-Pause Time |
| 200 |
Default: 0 sec: Delay between the measurements - 0 sec - no delay, next measurement is executed immediately after previous, 1 sec -1 sec delay be done next measurement is executed, etc. |
| 201 |
.1f |
| 202 |
STD-Pointer |
| 203 |
ON at STARTUP: Pointer with fl ash for 2 min. and will switch off when set to ON at STARTUP. Pointer will fl ash continuously when set to ON. |
| 204 |
Always On |
| 205 |
On At Startup |
| 206 |
No dust this mode is used mainly for demonstration purposes and dust-free applications. |
| 207 |
Fill Rate |
| 208 |
Empty Rate |
| 209 |
Range Blank |
| 210 |
Buffer |
| 211 |
Keep |
| 212 |
Environment |
| 213 |
Pause Time |
| 214 |
Pointer |
| 215 |
Program Type |
| 216 |
Standard |
| 217 |
Light Dust |
| 218 |
Heavy Dust |
| 219 |
Position |
| 220 |
Custom |
| 221 |
Media Range |
| 222 |
MEDIA RANGE is the net distance from the Laser face to the maximum application range (example: max distance from laser face to silo bottom). This value must be entered in units that correspond to the unit of the process variable. The max available range on SS140XP is 262 ft / 80m for level measurement to any natural target. |
| 223 |
.2f |
| 224 |
.0f |
| 225 |
Measure Mode |
| 226 |
Media Level refers to the Level Measurement from the silo bottom to the material surface. Distance refers to the distance measurement from the Laser Transmitter face to the material surface. |
| 227 |
Media Level |
| 228 |
Distance |
| 229 |
Level Offset |
| 230 |
Language |
| 231 |
English |
| 232 |
French |
| 233 |
German |
| 234 |
Spanish |
| 235 |
Portuguese |
| 236 |
Italian |
| 237 |
Russian |
| 238 |
Polish |
| 239 |
Chinese |
| 240 |
Alarm Delay |
| 241 |
Password |
| 242 |
This password controls access to Agent, FPGA, and Factory Menus |
| 243 |
Save Configuration |
| 244 |
Load Configuration |
| 245 |
Voltage 1 |
| 246 |
Voltage 2 |
| 247 |
Voltage 3 |
| 248 |
Voltage 4 |
| 249 |
Noise 1 |
| 250 |
Noise 2 |
| 251 |
Noise 3 |
| 252 |
Noise 4 |
| 253 |
Width 1 |
| 254 |
Width 2 |
| 255 |
Width 3 |
| 256 |
Width 4 |
| 257 |
Measurement 1 |
| 258 |
Measurement 2 |
| 259 |
Measurement 3 |
| 260 |
Measurement 4 |
| 261 |
Measured Buffer Item N |
| 262 |
Measured Buffer Item N-1 |
| 263 |
Measured Buffer Item N-2 |
| 264 |
Measured Buffer Item N-3 |
| 265 |
Xtal |
| 266 |
Sweep |
| 267 |
FPGA Frequency |
| 268 |
Laser Pump |
| 269 |
APD Pump |
| 270 |
Max = 130 Min = 30 |
| 271 |
XTAL_A Start |
| 272 |
Max = 235 Min = 225 |
| 273 |
XTAL_B Start |
| 274 |
Max = 100 Min = 25 |
| 275 |
Sweep Limits |
| 276 |
Max = 8 Min = 3 |
| 277 |
Sweep Counts @ 23m |
| 278 |
Max = 2000 Min = 1000 |
| 279 |
Software Build |
| 280 |
LD-Fill Rate |
| 281 |
LD-Empty Rate |
| 282 |
LD-Range Blank |
| 283 |
LD-Buffer |
| 284 |
LD-Keep |
| 285 |
LD-Environment |
| 286 |
LD-Pause Time |
| 287 |
LD-Pointer |
| 288 |
Application with air born dust. |
| 289 |
HD-Fill Rate |
| 290 |
HD-Empty Rate |
| 291 |
HD-Range Blank |
| 292 |
HD-Buffer |
| 293 |
HD-Keep |
| 294 |
HD-Environment |
| 295 |
HD-Pause Time |
| 296 |
HD-Pointer |
| 297 |
Applications with a lot of air-born dust (moderate dust). Product still can be seen. Typical applications are silos under fi ll conditions. |
| 298 |
Buffer, BUFFER_HLP |
| 299 |
POS-Fill Rate |
| 300 |
POS-Empty Rate |
| 301 |
POS-Range Blank |
| 302 |
POS-Buffer |
| 303 |
POS-Environment |
| 304 |
POS-Pause Time |
| 305 |
POS-Pointer |
| 306 |
TRACK position of moving machinery such as TRIPOD CAR. |
| 307 |
CUS-Fill Rate |
| 308 |
CUS-Empty Rate |
| 309 |
CUS-Range Blank |
| 310 |
CUS-Buffer |
| 311 |
CUS-Keep |
| 312 |
CUS-Environment |
| 313 |
CUS-Pause Time |
| 314 |
CUS-Pointer |
| 315 |
Variety of special applications, such as short process hoppers under fill condition with fast moving levels. |
| 316 |
Max Bias |
| 317 |
Max = 130 Min = 40 |
| 318 |
Min Bias |
| 319 |
Max = 50 Min = 30 |
| 320 |
Normal Attenuation |
| 321 |
Max = 19 Min = 0 |
| 322 |
Dust Attenuation |
| 323 |
Operating Noise |
| 324 |
Max = 32767 Min = 0 |
| 325 |
Max Signal Width |
| 326 |
Max = 250 Min = 150 |
| 327 |
Min Signal Width |
| 328 |
Pointer Activity Time |
| 329 |
Max = 600 Min = 1 |
| 330 |
System Counts |
| 331 |
SS140XP, No LCD |
| 332 |
SS140XP |
| 333 |
K-TEK |
| 334 |
Device Status Bits 0 |
| 335 |
EEProm Status |
| 336 |
ALU Status |
| 337 |
LCD Status |
| 338 |
External Ram Status |
| 339 |
Malloc Status |
| 340 |
Data Acq Status |
| 341 |
Level Status |
| 342 |
Reserved 00 |
| 343 |
Common Tables |
| 344 |
Interoperable * |
| 345 |
Universal |
| 346 |
Common Practice |
| 347 |
Pressure Universal |
| 348 |
Pressure Common |
| 349 |
Menu |
| 350 |
Rosemount Magflow |
| 351 |
Rosemount Pressure |
| 352 |
Moore Products |
| 353 |
Siemens Pressure |
| 354 |
P2 Common |
| 355 |
PV |
| 356 |
Munge |
| 357 |
Analytical Oxygen/Combustion/Methane/CO |
| 358 |
Flow Totalizer - Rate Indicator |
| 359 |
Flow Variable Area |
| 360 |
Flow Coriolis Mass |
| 361 |
Level Ultrasonic |
| 362 |
Level Radar - Microwave |
| 363 |
Pressure Absolute |
| 364 |
Level Capacitance |
| 365 |
Pressure Differential |
| 366 |
Level Hydrostatic |
| 367 |
Pressure Absolute/Relative |
| 368 |
Level Microwave |
| 369 |
Level Radar |
| 370 |
Level Density - Nuclear |
| 371 |
Pressure Deltabar S Evolution |
| 372 |
Pressure Cerabar S Evolution |
| 373 |
Flow Electromagnetic |
| 374 |
Flow Vortex |
| 375 |
Flow Magmeter - Rack Version |
| 376 |
Flow High Performance Magmeter |
| 377 |
Flow Mass |
| 378 |
Flow Ultrasonic |
| 379 |
Flow Magnetic |
| 380 |
Flow Magnetic - Custody Transfer |
| 381 |
Flow 2-wire Magnetic |
| 382 |
Flow Coriolis Mass - Custody Transfer |
| 383 |
Flow 2-wire Vortex |
| 384 |
Flow Thermal |
| 385 |
Temperature Head Mounted |
| 386 |
Temperature Compact |
| 387 |
Temperature DIN Rail Mounted |
| 388 |
Analytical pH |
| 389 |
Analytical Conductivity - Conductive |
| 390 |
Analytical Conductivity - Inductive |
| 391 |
Temperature Sensor |
| 392 |
Level Servo |
| 393 |
Temperature DIN Rail |
| 394 |
Temperature |
| 395 |
Analytical ORP |
| 396 |
Analytical pION |
| 397 |
Analytical IConc |
| 398 |
Analytical Electrode Conductivity |
| 399 |
Analytical Toroidal Conductivity |
| 400 |
Valve Controller |
| 401 |
Pressure |
| 402 |
Pressure Multivariable |
| 403 |
Analytical pH/ORP |
| 404 |
Flow Coriolis |
| 405 |
Analytical Conductivity |
| 406 |
Valve Positioner/Pneumatic |
| 407 |
Temperature Dual Input |
| 408 |
Valve Actuator |
| 409 |
Analytical Density - Nuclear |
| 410 |
Level Continuous Gamma |
| 411 |
Level Laser Ranging |
| 412 |
Pressure Safety |
| 413 |
Pressure P, dP + Multivariable |
| 414 |
Temperature 2-wire |
| 415 |
Pressure w/ PID |
| 416 |
Pressure Saturated Steam |
| 417 |
Analytical Density - Gamma Ray |
| 418 |
Level Gamma Ray |
| 419 |
Analytical Weight - Gamma Ray |
| 420 |
Level w/ Density - Gamma Ray |
| 421 |
Analytical Motorized Density |
| 422 |
Flow Multivariable Mass |
| 423 |
Temperature Multivariable |
| 424 |
Specialty HART-to-Analog Signal Conv |
| 425 |
Flow dP |
| 426 |
Pressure Low Power |
| 427 |
Pressure Certified SIL2 |
| 428 |
Interoperable |
| 429 |
Analytical Density |
| 430 |
Valve Positioner/Electropneumatic |
| 431 |
Flow Magnetic Inductive |
| 432 |
Flow |
| 433 |
Analytical Oxygen |
| 434 |
Analytical |
| 435 |
Analytical Opacity Monitor |
| 436 |
Analytical Oxygen/Combustion |
| 437 |
Analytical 2-wire Conductivity |
| 438 |
Analytical 2-wire Conductivity w/ pure H20 |
| 439 |
Analytical 2-wire Conductivity w/ % conc |
| 440 |
Analytical 2-wire Oxygen/Chlorine/Ozone |
| 441 |
Analytical 2-wire pH/ORP |
| 442 |
Analytical 2-wire Contacting/Toroidal |
| 443 |
Analytical Oxygen - High Temperature |
| 444 |
Analytical Conductivity w/ % conc |
| 445 |
Analytical pH/ORP/ISE |
| 446 |
Analytical Amperometric Analyzer |
| 447 |
Pressure Pressure/Level |
| 448 |
Analytical Consistency |
| 449 |
Analytical Microwave-Pulp Consistency |
| 450 |
Valve Digital Positioner |
| 451 |
Valve Positioner |
| 452 |
Valve Smart Valve Positioner |
| 453 |
Temperature Differential |
| 454 |
Analytical Dissolved Oxygen |
| 455 |
Analytical pH Controller |
| 456 |
Analytical Conductivity/Resistivity Controller |
| 457 |
Analytical Conductivity/Resistivity |
| 458 |
Level Displacement |
| 459 |
Temperature w/ PID |
| 460 |
Valve Universal Positioner |
| 461 |
Level Radar - Reflex |
| 462 |
Valve Digital Positioner w/ PID |
| 463 |
Valve Intelligent Positioner |
| 464 |
Analytical Gas Detector |
| 465 |
Analytical Infrared Gas Detector |
| 466 |
Analytical Electrochemical Gas Detector |
| 467 |
Level Magnostrictive |
| 468 |
Valve On/Off Valve Controller |
| 469 |
Level Radar - Pulse |
| 470 |
Analytical Corrosion |
| 471 |
Level Continuous Capactive |
| 472 |
Valve Damper Actuator |
| 473 |
Valve Electric Damper Actuator |
| 474 |
Flow Electronic |
| 475 |
Flow Vortex - Multiparameter Mass |
| 476 |
Analytical Flame Detector |
| 477 |
Level Nuclear |
| 478 |
Analytical Density - Radiometric |
| 479 |
Level Radiometric |
| 480 |
Analytical Gas/Steam |
| 481 |
Level Nucleonic |
| 482 |
Analytical Blade Consistency |
| 483 |
Analytical Rotary Consistency |
| 484 |
FMU860 |
| 485 |
DT |
| 486 |
DVC |
| 487 |
FCX |
| 488 |
AS800 |
| 489 |
340T |
| 490 |
340C |
| 491 |
344 |
| 492 |
Siemens Micro K |
| 493 |
SITRANS L |
| 494 |
SIPAN PH |
| 495 |
SITRANS P |
| 496 |
75SMT |
| 497 |
UNIDELTA |
| 498 |
8320 |
| 499 |
SX5100 |
| 500 |
TSV175 |
| 501 |
DMU |
| 502 |
3780 |
| 503 |
BM70 |
| 504 |
8u |
| 505 |
Device Variable |
| 506 |
Requesting diagnostic info.
Please wait... |
| 507 |
Xtal=%[.1f]{diag_xtal} Sweep=%{diag_sweep}
0) %{diag_voltage_0}V %{diag_noise_0}n %[.2f]{diag_width_0}w %[.2f]{diag_measurement_0}m
1) %{diag_voltage_1}V %{diag_noise_1}n %[.2f]{diag_width_1}w %[.2f]{diag_measurement_1}m
FPGA Freq=%[.1f]{diag_fpga_freq}Hz
Select [OK] to repeat, or [ABORT] to exit |
| 508 |
Xtal=%[.1f]{diag_xtal} Sweep=%{diag_sweep}
0) %{diag_voltage_0}V %{diag_noise_0}n %[.1f]{diag_width_0}w %[.1f]{diag_measurement_0}m
1) %{diag_voltage_1}V %{diag_noise_1}n %[.1f]{diag_width_1}w %[.1f]{diag_measurement_1}m
FPGA Freq=%[.1f]{diag_fpga_freq}Hz
Select [OK] to repeat, or [ABORT] to exit |
| 509 |
0) %{diag_voltage_0}V %{diag_noise_0}n %[.2f]{diag_width_0}w %[.2f]{diag_measurement_0}m %[c]{index_0}
1) %{diag_voltage_1}V %{diag_noise_1}n %[.2f]{diag_width_1}w %[.2f]{diag_measurement_1}m %[c]{index_1}
2) %{diag_voltage_2}V %{diag_noise_2}n %[.2f]{diag_width_2}w %[.2f]{diag_measurement_2}m %[c]{index_2}
3) %{diag_voltage_3}V %{diag_noise_3}n %[.2f]{diag_width_3}w %[.2f]{diag_measurement_3}m %[c]{index_3}
* - Selected Measurement
Select [OK] to repeat, or [ABORT] to exit |
| 510 |
0) %{diag_voltage_0}V %{diag_noise_0}n %[.1f]{diag_width_0}w %[.1f]{diag_measurement_0}m %[c]{index_0}
1) %{diag_voltage_1}V %{diag_noise_1}n %[.1f]{diag_width_1}w %[.1f]{diag_measurement_1}m %[c]{index_1}
2) %{diag_voltage_2}V %{diag_noise_2}n %[.1f]{diag_width_2}w %[.1f]{diag_measurement_2}m %[c]{index_2}
3) %{diag_voltage_3}V %{diag_noise_3}n %[.1f]{diag_width_3}w %[.1f]{diag_measurement_3}m %[c]{index_3}
* - Selected Measurement
Select [OK] to repeat, or [ABORT] to exit |
| 511 |
Timeout initializing crystal test mode. |
| 512 |
Xtal=%{0} Sweep=%{1}
Enter new Xtal value: |
| 513 |
This action will overwrite the factory-default backup,
or any previously-saved configurations.
Are you sure you wish to proceed? |
| 514 |
No;Yes |
| 515 |
This action will overwrite the current configuration with the last-saved backup (either by factory or by customer).
Are you sure you wish to proceed? |
| 516 |
This action will reset the laser program parameters to their factory defaults.
Are you sure you wish to proceed? |