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Name | ID | Label | Description | Type | Access | Class |
---|---|---|---|---|---|---|
redundant_lower_sensor_limit | 4077 | Lower Limit | Lower Sensor Limit Value- Defines the minimum usable value for the Lower Range Value. | R | Float | 0 |
redundant_minimum_span | 4078 | Min Span | Minimum Span Value- Defines the smallest allowable difference between the Upper Range Value and the Lower Range Value. | R | Float | 0 |
Redqty | 40E3 | Red Value Status | Process Data Quality- Indicates the overall process data quality of the device variable value. | R | Enum | 2 |
primary_variable_code_LOCAL | 40E4 | PV is | Primary Index into Dynamic Variables Array- An index location, that indicates which Field Device dynamic variable has been mapped into the Primary Variable dynamic variable | R/W | Enum | 4096 |
secondary_variable_code_LOCAL | 40E5 | SV is | Secondary Index into Dynamic Variables Array- An index location, that indicates which Field Device dynamic variable has been mapped into the Secondary Variable dynamic variable | R/W | Enum | 4096 |
tertiary_variable_code_LOCAL | 40E6 | TV is | Tertiary Index into Dynamic Variables Array- An index location, that indicates which Field Device dynamic variable has been mapped into the Tertiary Variable dynamic variable | R/W | Enum | 4096 |
quaternary_variable_code_LOCAL | 40E7 | QV is | Quaternary Index into Dynamic Variables Array- An index location, that indicates which Field Device dynamic variable has been mapped into the Quaternary Variable dynamic variable | R/W | Enum | 4096 |
LO_LMT | 40E8 | Low saturation | R/W | Float | 4096 | |
GOOD_LMT | 40E9 | Good | R/W | Float | 4096 | |
HI_HI_LMT | 40EA | High alarm | R/W | Float | 4096 | |
sensor1_probe_type_local | 40EB | Sensor type | Select Sensor type for: a) Resistors (potentiometer) b) Resistance thermometers (RTD) c) Callendar-Van Dusen (RTD) d) Fix Point Curves for RTD (customer specific)) e) Voltage measurement f) Thermocouples g) Fix Point Curves for thermocouples (customer specific) Please check the measurement range and HART Variable mapping for device variables after Sensor Change | R/W | Enum | 4096 |
sensor2_probe_type_local | 40EC | Sensor type | Select Sensor type for: a) Resistors (potentiometer) b) Resistance thermometers (RTD) c) Callendar-Van Dusen (RTD) d) Fix Point Curves for RTD (customer specific)) e) Voltage measurement f) Thermocouples g) Fix Point Curves for thermocouples (customer specific) Please check the measurement range and HART Variable mapping for device variables after Sensor Change | R/W | Enum | 4096 |
Default_val_cel_Ohm | 40ED | Default: | R/W | Enum | 4096 | |
Default_val_cel | 40EE | Default: | R/W | Enum | 4096 | |
InputUnit_Fixpoint_grid | 40EF | R | Enum | 4096 | ||
OutputUnit_Fixpoint_grid | 40F0 | R | Enum | 4096 | ||
Trend_selection_Byte | 40F1 | Trend Selection Byte | R/W | BitEnum | 4096 | |
CfgMonHeadLineNbr | 40F2 | No. | Index Number for Configuration Change (max 50 changes) | R | ASCII | 4096 |
CfgMonHeadLineTimeStamp | 40F3 | Time Stamp | Operation Time | R | ASCII | 4096 |
CfgMonHeadLineConfigChangeCounter | 40F4 | Config. Change Count | Configuration Change Counter- This indicates the number of times the devices configuration or calibration has been changed by a host application or from a local operator interface | R | ASCII | 4096 |
CfgMonHeadLineChangedItem | 40F5 | Change | Changes in Device | R | ASCII | 4096 |
EventMonHeadLineNbr | 40F6 | No. | Index number for Events (max 48 events) | R | ASCII | 4096 |
EventMonHeadLineTimeStamp | 40F7 | Time Stamp | Operation Time | R | ASCII | 4096 |
EventMonHeadLineChangedItem | 40F8 | Event | Event in Device | R | ASCII | 4096 |
EmcFilterSettings | 4122 | EMC Filter strength | Recommended value (default): LOW | R/W | Enum | 0 |
Name | ID | Label | Description | Type | Access | Class |