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名称 | ID | 标签 | 描述 | 类型 | 访问 | 分类 |
---|---|---|---|---|---|---|
redundant_lower_sensor_limit | 4077 | Lower Limit | 传感器下限值——定义上限值的最小可用数值。 | 读 | 浮点 | 0 |
redundant_minimum_span | 4078 | Min Span | 最小范围值——定义上限值和下限值之间允许的最小差。 | 读 | 浮点 | 0 |
Redqty | 40E3 | ????? | 过程数据质量——表示设备变量值的整体过程数据质量。 | 读 | 枚举 | 2 |
primary_variable_code_LOCAL | 40E4 | 主变量为 | 动态变量阵列第一索引——表示已经映射至第一动态变量的现场设备变量的索引位置。 | 读/写 | 枚举 | 4096 |
secondary_variable_code_LOCAL | 40E5 | 第2变量为 | 动态变量阵列第二索引——表示已经映射至第二动态变量的现场设备变量的索引位置。 | 读/写 | 枚举 | 4096 |
tertiary_variable_code_LOCAL | 40E6 | 第3变量为 | 动态变量阵列第三索引——表示已经映射至第三动态变量的现场设备变量的索引位置。 | 读/写 | 枚举 | 4096 |
quaternary_variable_code_LOCAL | 40E7 | 第4变量为 | 动态变量阵列第4索引——表示现场设备动态变量已被映射至第4变量动态变量的索引位置。 | 读/写 | 枚举 | 4096 |
LO_LMT | 40E8 | Low saturation | 读/写 | 浮点 | 4096 | |
GOOD_LMT | 40E9 | Good | 读/写 | 浮点 | 4096 | |
HI_HI_LMT | 40EA | High alarm | 读/写 | 浮点 | 4096 | |
sensor1_probe_type_local | 40EB | Sensor type | Select Sensor type for: a) Resistors (potentiometer) b) Resistance thermometers (RTD) c) Callendar-Van Dusen (RTD) d) Fix Point Curves for RTD (customer specific)) e) Voltage measurement f) Thermocouples g) Fix Point Curves for thermocouples (customer specific) Please check the measurement range and HART Variable mapping for device variables after Sensor Change | 读/写 | 枚举 | 4096 |
sensor2_probe_type_local | 40EC | Sensor type | Select Sensor type for: a) Resistors (potentiometer) b) Resistance thermometers (RTD) c) Callendar-Van Dusen (RTD) d) Fix Point Curves for RTD (customer specific)) e) Voltage measurement f) Thermocouples g) Fix Point Curves for thermocouples (customer specific) Please check the measurement range and HART Variable mapping for device variables after Sensor Change | 读/写 | 枚举 | 4096 |
Default_val_cel_Ohm | 40ED | Default: | 读/写 | 枚举 | 4096 | |
Default_val_cel | 40EE | Default: | 读/写 | 枚举 | 4096 | |
InputUnit_Fixpoint_grid | 40EF | 读 | 枚举 | 4096 | ||
OutputUnit_Fixpoint_grid | 40F0 | 读 | 枚举 | 4096 | ||
Trend_selection_Byte | 40F1 | Trend Selection Byte | 读/写 | 位枚举 | 4096 | |
CfgMonHeadLineNbr | 40F2 | No. | Index Number for Configuration Change (max 50 changes) | 读 | ASCII | 4096 |
CfgMonHeadLineTimeStamp | 40F3 | Time Stamp | Operation Time | 读 | ASCII | 4096 |
CfgMonHeadLineConfigChangeCounter | 40F4 | Config. Change Count | Configuration Change Counter- This indicates the number of times the devices configuration or calibration has been changed by a host application or from a local operator interface | 读 | ASCII | 4096 |
CfgMonHeadLineChangedItem | 40F5 | Change | Changes in Device | 读 | ASCII | 4096 |
EventMonHeadLineNbr | 40F6 | No. | Index number for Events (max 48 events) | 读 | ASCII | 4096 |
EventMonHeadLineTimeStamp | 40F7 | Time Stamp | Operation Time | 读 | ASCII | 4096 |
EventMonHeadLineChangedItem | 40F8 | Event | Event in Device | 读 | ASCII | 4096 |
EmcFilterSettings | 4122 | EMC Filter strength | Recommended value (default): LOW | 读/写 | 枚举 | 0 |
名称 | ID | 标签 | 描述 | 类型 | 访问 | 分类 |